Two-fluid measurements on thin films /

Saved in:
Bibliographic Details
Main Author: Mopsik, F. I.
Corporate Author: United States. National Bureau of Standards
Format: Government Document Electronic eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Series:NIST technical note ; 1294.
Online Access:CONNECT