An analytical and experimental determination of the cutoff frequencies of higher-order TE modes in a TEM cell /

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Bibliographic Details
Main Author: Tippet, John C.
Corporate Author: United States. National Bureau of Standards
Other Authors: Chang, David C., Crawford, M. L.
Format: Government Document Electronic eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1976.
Series:NBSIR ; 76-841.
Online Access:CONNECT