Thin film materials : stress, defect formation, and surface evolution /

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film material...

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Bibliographic Details
Main Authors: Freund, L. B. (Author), Suresh, S. (Author)
Format: eBook
Published: Cambridge : Cambridge University Press, 2003.
Online Access:CONNECT