Proceedings of the First International Symposium On Analytical Methods In Philately /

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Bibliographic Details
Corporate Author: International Symposium on Analytical Methods in Philately Washington, DC
Other Authors: Lera, Thomas M. (Editor), Barwis, John H. (Editor), Herendeen, David L., -2013 (Editor)
Format: Government Document Electronic Conference Proceeding eBook
Language:English
Published: Washington, D.C. : Smithsonian Institution Scholarly Press, 2013.
Series:Smithsonian contributions to history and technology ; no. 57.
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Online Access:CONNECT