High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts /
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| Corporate Authors: | , , |
|---|---|
| Other Authors: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
c1991.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 1384. |
| Subjects: |
