High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts /

High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts /

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Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Symposium on Advances in Intelligent Systems, OE/Boston '90
Other Authors: Chen, Michael J. W.
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE, c1991.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1384.
Subjects:
Quality control > Optical methods > Automation > Congresses.
Computer vision > Congresses.
Automatic test equipment > Industrial applications > Congresses.
Optical character recognition devices > Industrial applications > Congresses.

Main Collection - Walker Library - 4th Floor

Holdings details from Main Collection - Walker Library - 4th Floor
Call Number: 620.0044 H53c
Copy 1 Available  Pull and Hold

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