High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts /

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Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Symposium on Advances in Intelligent Systems, OE/Boston '90
Other Authors: Chen, Michael J. W.
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE, c1991.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 1384.
Subjects:
Description
Item Description:"Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts"--P. viii.
Physical Description:ix, 355 p. : ill. ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819404519