Forensic psychology and psychiatry /

Forensic psychology and psychiatry /

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Bibliographic Details
Corporate Authors: New York Academy of Sciences, National Institute of Law Enforcement and Criminal Justice
Other Authors: Wright, Fred, Bahn, Charles, Rieber, R. W.
Format: Book
Language:English
Published: New York, N.Y. : New York Academy of Sciences, 1980.
Series:Annals of the New York Academy of Sciences ; v. 347.
Subjects:
Forensic psychology > Congresses.
Forensic psychiatry > Congresses.

Main Collection - Walker Library - 4th Floor

Holdings details from Main Collection - Walker Library - 4th Floor
Call Number: 614.19 F761
Copy 1 Available  Pull and Hold

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