Optical imaging and metrology : advanced technologies /
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leadin...
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| Other Authors: | , |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Weinheim : Chichester :
Wiley-VCH ; John Wiley [distributor],
2012.
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| Subjects: | |
| Online Access: | CONNECT |
| Summary: | A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends. |
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| Item Description: | Wiley EBA |
| Physical Description: | 1 online resource : color illustrations |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783527648443 9783527648474 352764847X 9783527648467 3527648461 9783527648450 3527648453 3527648445 9781280782824 128078282X |
