Optical imaging and metrology : advanced technologies /
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leadin...
Saved in:
| Other Authors: | , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Weinheim : Chichester :
Wiley-VCH ; John Wiley [distributor],
2012.
|
| Subjects: | |
| Online Access: | CONNECT |
