X-ray characterization of materials /
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor fil...
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| Other Authors: | |
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| Format: | Electronic eBook |
| Language: | English |
| Published: |
Weinheim ; New York :
Wiley-VCH,
©1999.
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| Subjects: | |
| Online Access: | CONNECT |
