Thin film analysis by X-ray scattering /
With contributions by Paul F. Fewster and Christoph Genzel. While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t...
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| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Weinheim :
Wiley-VCH,
©2006.
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| Online Access: | CONNECT |
