Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra /

This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spec...

Full description

Saved in:
Bibliographic Details
Main Author: Mikhailov, Igor F.
Other Authors: Baturin, Alexey A., Mikhailov, Anton I.
Format: Electronic eBook
Language:English
Published: Newcastle-upon-Tyne : Cambridge Scholars Publisher, 2020.
Subjects:
Online Access:CONNECT