Characterization of defects and deep levels for GaN power devices /
This book focuses on defects in GaN based on the most up-to-date intrinsic material properties, and addresses deep levels and their analytical methods within the wide bandgap of GaN. It demonstrates nanoscale structures of extended defects in GaN using atomic-scale transmission electron microscopy....
Saved in:
| Other Authors: | , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Melville, New York :
AIP Publishing Books,
2020.
|
| Edition: | First edition. |
| Subjects: | |
| Online Access: | CONNECT |
MARC
| LEADER | 00000cam a2200000Ii 4500 | ||
|---|---|---|---|
| 001 | in00005976240 | ||
| 006 | m o d | ||
| 007 | cr ||||||||||| | ||
| 008 | 210222t20202020nyua ob 001 0 eng d | ||
| 005 | 20210729174823.1 | ||
| 035 | |a (OCoLC)on1238037091 | ||
| 040 | |a CUF |b eng |e rda |c CUF |d OCLCO |d CUF |d SFB |d OCLCF |d IAI |d OCLCO |d TXM | ||
| 020 | |a 9780735422698 |q (electronic book) | ||
| 020 | |a 0735422699 |q (electronic book) | ||
| 020 | |a 9780735422711 |q (electronic book) | ||
| 020 | |a 0735422710 |q (electronic book) | ||
| 020 | |a 9780735422728 |q (electronic book) | ||
| 020 | |a 0735422729 |q (electronic book) | ||
| 020 | |z 9780735422704 |q (softcover) | ||
| 020 | |z 0735422702 |q (softcover) | ||
| 035 | |a (OCoLC)1238037091 | ||
| 050 | 4 | |a TK7871.15.G33 |b C53 2020eb | |
| 049 | |a TXMM | ||
| 245 | 0 | 0 | |a Characterization of defects and deep levels for GaN power devices / |c edited by Tetsuo Narita, Tetsu Kachi. |
| 250 | |a First edition. | ||
| 264 | 1 | |a Melville, New York : |b AIP Publishing Books, |c 2020. | |
| 264 | 4 | |c ©2020 | |
| 300 | |a 1 online resource : |b illustrations (some color) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a Published online by AIP Publishing, November 2020. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Introduction / Tetsuo Narita and Tetsu Kachi -- Methods of analyzing deep levels in GaN / Tetsuo Narita and Yutaka Tokuda -- Deep levels in GaN / Tetsuo Narita and Yutaka Tokuda -- Structural defects in Mg-doped GaN: TEM analysis / Nobuyuki Ikarashi -- Combined APT and STEM analyses / Ashutosh Kumar and Tadakatsu Ohkubo -- Local lattice plane orientation mapping of entire GaN wafer / Osami Sakata and Jaemyung Kim -- Multiphoton microscopy / Tomoyuki Tanikawa -- Future challenges: defects in GaN power devices due to fabrication processes / Tetsuo Narita and Tetsu Kachi. | |
| 520 | |a This book focuses on defects in GaN based on the most up-to-date intrinsic material properties, and addresses deep levels and their analytical methods within the wide bandgap of GaN. It demonstrates nanoscale structures of extended defects in GaN using atomic-scale transmission electron microscopy. The identifi cations of their deep levels and extended defect structures are presented by comparing with reported fi rst-principles calculations. It reviews emerging technologies for defect characterizations using atom probe tomography, synchrotron x-ray diffraction topography in wafer scale, and multiphoton-excitation photoluminescence, which allows for the multidirectional characterization of structural defects. | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Power electronics. | |
| 650 | 0 | |a Gallium nitride |x Electric properties. | |
| 650 | 7 | |a Gallium nitride |x Electric properties. |2 fast |0 (OCoLC)fst00937296 | |
| 650 | 7 | |a Power electronics. |2 fast |0 (OCoLC)fst01074238 | |
| 700 | 1 | |a Narita, Tetsuo, |e editor | |
| 700 | 1 | |a Kachi, Tetsu, |e editor | |
| 710 | 2 | |a AIP Publishing LLC, |e publisher. | |
| 730 | 0 | |a First Collection. AIP Publishing | |
| 776 | 0 | 8 | |i Print version: |t Characterization of defects and deep levels for GaN power devices. |b First edition. |d Melville, New York : AIP Publishing Books, 2020 |z 9780735422704 |w (OCoLC)1247692443 |
| 856 | 4 | 0 | |u https://ezproxy.mtsu.edu/login?url=https://doi.org/10.1063/9780735422698 |3 AIP Publishing |z CONNECT |t 0 |
| 903 | |a OWNED | ||
| 949 | |a ho0 | ||
| 994 | |a C0 |b TXM | ||
| 998 | |a wi |d z | ||
| 999 | f | f | |s 4292f9af-3fe1-4021-ae2c-e61b960b3610 |i 4292f9af-3fe1-4021-ae2c-e61b960b3610 |t 0 |
| 952 | f | f | |a Middle Tennessee State University |b Main |c James E. Walker Library |d Electronic Resources |t 0 |e TK7871.15.G33 C53 2020eb |h Library of Congress classification |
