Author
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Fullam, Scott F.
1
Gabrys, Jennifer
3
Gaillardon, Pierre-Emmanuel,
1
Gandhi, Tejinder,
1
Ganesan, Sanka
1
Georgiadis, Apostolos,
1
Giacoletto, Lawrence Joseph, 1916-
1
Glasoe, G. Norris, 1902-
1
Goldberg, Joel, 1931-
1
Goldberg, Lee H.
1
Goodman, Robert L.
3
Gopinath, Anand,
1
Gossner, Harald
1
Gottlieb, Irving M.
2
Graham, Brad
1
Griffin, Norman Bernard, 1912-
1
Grossman, Elizabeth, 1957-
3
Halkias, Christos C.
1
Harley, Robert,
1
Harper, Charles A.
1
Havrilla, K.
1
Hemami, A.,
1
Henderson, Andrew
1
Henry, Richard W. 1932-
1
Herrick, Clyde N.
3
Hindawi Publishing Corporation
1
Hnatek, Eugene R.
2
Huang, Andrew,
1
IEEE Broadcast, Cable, and Consumer Electronics Society
1
IEEE Consumer Electronics Group
1
IEEE Consumer Electronics Society
1
IEEE Electron Devices Society
5
IEEE International Conference on Consumer Electronics
1
IEEE Reliability Society
1
IEEE TAB Steering Committee on Design and Manufacturing Engineering
1
IFMA Foundation
1
INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (35TH: 2009: SAN JOSE, CALIF.)
1
Iannini, Robert E.
1
Impact Partners (Firm)
1
Imran, Abu Bin,
1
Institute of Electrical and Electronics Engineers
4
Institute of Electrical and Electronics Engineers. Electron Devices Group
2
Institution of Electrical Engineers
1
International Conference on Components, Packaging and Manufacturing Technology Sanya Shi, China)
1
International Conference on Knowledge-Based Intelligent Information and Engineering Systems University of Milan)
1
International Conference on Packaging and Manufacturing Technology Brisbane Australia)
1
International Measurement Confederation. Technical Committee on Measurement of Electrical Quantities. Symposium
1
International Symposium for Testing and Failure Analysis
1
International Symposium for Testing and Failure Analysis Austin, Tex.)
1
International Symposium for Testing and Failure Analysis Dallas, Tex.)
2
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