Author
ASM International
13
Electronic Device Failure Analysis Society
12
NetLibrary, Inc
9
Luther, Linda G.,
6
Monk, Simon,
5
United States. National Bureau of Standards
5
International Symposium for Testing and Failure Analysis San Jose, Calif.)
4
Marsden, Charles P.
4
Platt, Charles,
4
Safari, an O'Reilly Media Company
4
United States. Congress. House. Committee on Homeland Security. Subcommittee on Cybersecurity, Infrastructure Protection, and Security Technologies,
4
Gabrys, Jennifer
3
Goodman, Robert L.
3
Grossman, Elizabeth, 1957-
3
Herrick, Clyde N.
3
International Symposium for Testing and Failure Analysis Santa Clara, Calif.)
3
Middleton, Robert Gordon, 1908-
3
Pecht, Michael
3
American Society of Heating, Refrigerating and Air-Conditioning Engineers
2
Avtgis, Alexander W., 1931-
2
Boylestad, Robert L.
2
Brindley, Keith
2
Caswell, Greg,
2
Cousins, Keith
2
Cutcher, Dave
2
Davidson, David B.,
2
DiResta, Renee,
2
Domingo, George, 1937-
2
Dummer, G. W. A.
2
Feng, Zhe Chuan
2
Franssila, Sami
2
Gottlieb, Irving M.
2
Hnatek, Eugene R.
2
IEEE Electron Devices Society
2
International Symposium for Testing and Failure Analysis Dallas, Tex.)
2
Irene, Eugene A.
2
Karris, Steven T.
2
Lenk, John D.
2
Megow, William F., 1936-
2
Monk, Simon
2
Morrison, Ralph
2
Nashelsky, Louis
2
O'Flynn, Colin,
2
Pascoe, Norman
2
Platt, Charles
2
Rush, Christopher,
2
Schuster, Donald H.
2
Schwartz, Marco,
2
Shina, Sammy G.
2
Silberstein, Mordechai
2
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