Measurement assurance for dimensional measurements on integrated-circuit photomasks /
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Main Author: | |
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Corporate Author: | |
Format: | Government Document eBook |
Language: | English |
Published: |
Gaithersburg, MD :
U.S. Dept. of Commerce, National Institute of Standards and Technology,
1982.
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Series: | NBS technical note ;
1164. |
Subjects: | |
Online Access: | CONNECT CONNECT |
Item Description: | 1982. Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. Title from PDF title page. |
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Physical Description: | 1 online resource. |
Bibliography: | Includes bibliographical references. |