Characterization of silicon-gate CMOS/SOS integrated circuits processed with ion implantation /

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Bibliographic Details
Main Author: Woo, D. S. (Author)
Corporate Author: Solid State Technology Center (RCA Corporation)
Format: Government Document eBook
Language:English
Published: Marshall Space Flight Center, AL : George C. Marshall Space Flight Center, January 1982.
Series:NASA contractor report ; NASA CR-161988.
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