On the effect of ramp rate in damage accumulation of the CPV die-attach preprint /

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Bibliographic Details
Main Author: Bosco, Nick.
Corporate Authors: National Renewable Energy Laboratory (U.S.), IEEE Photovoltaic Specialists Conference
Other Authors: Silverman, Timothy J., Kurtz, S. R.
Format: Government Document Electronic Conference Proceeding eBook
Published: [Golden, CO] : National Renewable Energy Laboratory, [2012]
Series:Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5200-54092.
Online Access:CONNECT
Item Description:Title from title screen (viewed on Aug. 6, 2012).
"June 2012."
"Presented at the 2012 IEEE Photovoltaic Specialists Conference, Austin, Taxas, June 3-8, 2012."
Physical Description:1 online resource (6 p.) : ill. (some col.).
Bibliography:Includes bibliographical references (p. 6).