Heat entrapment effects within liquid acquisition devices

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Bibliographic Details
Main Author: Duval, W. M. B.
Corporate Authors: NASA Glenn Research Center., AIAA Aerospace Sciences Meeting
Other Authors: D. J. Chato., Doherty, M. P.
Format: Government Document Electronic Conference Proceeding eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2010]
Series:NASA technical memorandum ; 216789.
Subjects:
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