Measurement assurance program for wavelength dependence of polarization dependent loss of fiber optic devices in the 1535 nm to 1560 nm wavelength range

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Bibliographic Details
Main Author: Craig, Rex M.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Wang, Chih-Ming.
Format: Government Document Electronic eBook
Language:English
Published: [Boulder, Colo.] : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2003]
Series:NIST special publication. NIST measurement services.
NIST special publication ; 250-60.
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