Applied survival analysis : regression modeling of time to event data /

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Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York : Wiley, c1999.
Series:Wiley series in probability and statistics. Texts and reference section
Subjects:
Description
Item Description:"A Wiley-Interscience publication."
Physical Description:xiii, 386 p. : ill. ; 25 cm.
Bibliography:Includes bibliographical references (p. 365-377) and index.
ISBN:0471154105 (cloth : alk. paper)
047119025X