Forensic psychology and psychiatry /

Forensic psychology and psychiatry /

Saved in:
Bibliographic Details
Corporate Authors: New York Academy of Sciences., National Institute of Law Enforcement and Criminal Justice.
Other Authors: Wright, Fred., Bahn, Charles., Rieber, R. W.
Format: Book
Language:English
Published: New York, N.Y. : New York Academy of Sciences, 1980.
Series:Annals of the New York Academy of Sciences ; v. 347.
Subjects:
Forensic psychology > Congresses.
Forensic psychiatry > Congresses.

Similar Items

Similar Items