New approaches to image processing based failure analysis of nano-scale ULSI devices /
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance...
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| Main Author: | |
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| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Oxford :
William Andrew,
2014.
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| Series: | Micro & nano technologies.
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| Subjects: | |
| Online Access: | CONNECT |
