Trap level spectroscopy in amorphous semiconductors /
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscop...
Saved in:
Main Author: | |
---|---|
Format: | Electronic eBook |
Language: | English |
Published: |
Oxford :
Elsevier,
2010.
|
Series: | Elsevier insights.
|
Subjects: | |
Online Access: | CONNECT |
MARC
LEADER | 00000cam a2200000 a 4500 | ||
---|---|---|---|
001 | in00006555524 | ||
006 | m o d | ||
007 | cr cn||||||||| | ||
008 | 100714s2010 enka o 000 0 eng d | ||
005 | 20240708135031.8 | ||
035 | |a 1WRLDSHRocn647765364 | ||
040 | |a OPELS |b eng |e pn |c OPELS |d CDX |d OCLCQ |d OCLCF |d D6H |d WYU |d LEAUB |d OL$ |d OCLCO |d OCLCQ |d OCLCO |d OCLCQ |d OCLCL |d SXB | ||
015 | |a GBB045319 |2 bnb | ||
016 | 7 | |a 015521492 |2 Uk | |
019 | |a 1066576802 |a 1102537484 | ||
020 | |a 9780123847157 | ||
020 | |a 012384715X | ||
035 | |a (OCoLC)647765364 |z (OCoLC)1066576802 |z (OCoLC)1102537484 | ||
037 | |a 1098708:10929071 |b Elsevier Science & Technology |n http://www.sciencedirect.com | ||
050 | 4 | |a QC611.8.A5 |b M55 2010 | |
082 | 0 | 4 | |a 537.6223 |2 22 |
049 | |a TXMM | ||
100 | 1 | |a Mikla, Victor I. | |
245 | 1 | 0 | |a Trap level spectroscopy in amorphous semiconductors / |c Viktor I. Mikla. |
260 | |a Oxford : |b Elsevier, |c 2010. | ||
300 | |a 1 online resource | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
490 | 1 | |a Elsevier insights | |
520 | |a Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniques Discusses the advantages and disadvantages of each technique. | ||
505 | 0 | |a Thermally stimulated depolarization currents in amorphous chalcogenides -- Carrier transport processes in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semiconductors -- Xerographic spectroscopy of states in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors. | |
588 | 0 | |a Print version record. | |
504 | |a Includes bibliographical references. | ||
500 | |a ScienceDirect eBook - Materials Science 2010 (Elsevier and Woodhead) |5 TMurS | ||
650 | 0 | |a Amorphous semiconductors |x Spectra. | |
650 | 0 | |a Amorphous semiconductors |x Defects |x Analysis. | |
650 | 0 | |a Deep level transient spectroscopy. | |
730 | 0 | |a WORLDSHARE SUB RECORDS | |
758 | |i has work: |a Trap level spectroscopy in amorphous semiconductors (Text) |1 https://id.oclc.org/worldcat/entity/E39PCH7fPPDk77CwkRgbvtkBCP |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
776 | 0 | 8 | |i Print version: |a Mikla, Victor I. |t Trap level spectroscopy in amorphous semiconductors. |d Oxford : Elsevier, 2010 |z 9780123847157 |z 012384715X |w (OCoLC)567148516 |
830 | 0 | |a Elsevier insights. | |
856 | 4 | 0 | |u https://ezproxy.mtsu.edu/login?url=https://www.sciencedirect.com/science/book/9780123847157 |z CONNECT |3 Elsevier |t 0 |
949 | |a ho0 | ||
994 | |a 92 |b TXM | ||
998 | |a wi |d z | ||
999 | f | f | |s b4ccdf6c-64f1-4508-96ff-bccc4570d19d |i 6015aa21-4ac5-40c2-b2f3-a22c0d50844e |t 0 |
952 | f | f | |a Middle Tennessee State University |b Main |c James E. Walker Library |d Electronic Resources |t 0 |e QC611.8.A5 M55 2010 |h Library of Congress classification |