Exploring scanning probe microscopy with Mathematica /
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scann...
Saved in:
| Main Author: | |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
Weinheim :
Wiley-VCH,
©2007.
|
| Edition: | 2nd completely rev. and enl. ed. |
| Subjects: | |
| Online Access: | CONNECT CONNECT |
Table of Contents:
- Introduction
- Uniform cantilevers
- Cantilever conversion tables
- V-shaped cantilevers
- Tip-sample adhesion
- Tip-sample force curve
- Free vibrations
- Noncontact mode
- Metal-insulator-metal tunneling
- Fowler-Norheim tunneling
- Coulomb blockade
- Density of states
- Electrostatics
- Near-field optics
- Construction and boundary resistance
- Scanning thermal conductivity microscopy
- Kelvin probe force microscopy
- Raman scattering in nanocrystals.
