Exploring scanning probe microscopy with Mathematica /
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scann...
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| Main Author: | |
|---|---|
| Format: | eBook |
| Language: | English |
| Published: |
Weinheim :
Wiley-VCH,
©2007.
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| Edition: | 2nd completely rev. and enl. ed. |
| Subjects: | |
| Online Access: | CONNECT CONNECT |
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| 100 | 1 | |a Sarid, Dror. | |
| 245 | 1 | 0 | |a Exploring scanning probe microscopy with Mathematica / |c Dror Sarid. |
| 250 | |a 2nd completely rev. and enl. ed. | ||
| 260 | |a Weinheim : |b Wiley-VCH, |c ©2007. | ||
| 300 | |a 1 online resource (310 pages : : |b illustrations.) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a Previous edition: New York; Chichester : Wiley, ©1997. | ||
| 500 | |a Accompanied by a CD-ROM containing a Mathematica-compatible notebook (.nb file) of code for each chapter of the book. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Introduction -- Uniform cantilevers -- Cantilever conversion tables -- V-shaped cantilevers -- Tip-sample adhesion -- Tip-sample force curve -- Free vibrations -- Noncontact mode -- Metal-insulator-metal tunneling -- Fowler-Norheim tunneling -- Coulomb blockade -- Density of states -- Electrostatics -- Near-field optics -- Construction and boundary resistance -- Scanning thermal conductivity microscopy -- Kelvin probe force microscopy -- Raman scattering in nanocrystals. | |
| 520 | |a This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs. | ||
| 588 | |a Description based on print version record. | ||
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| 650 | 0 | |a Scanning probe microscopy |x Data processing. | |
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