Optical metrology /

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.* New introductory sections to all chapters.* Detailed discussion on lasers and laser principles, including an introduction to radiometry and p...

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Bibliographic Details
Main Author: Gåsvik, Kjell J.
Format: Electronic eBook
Language:English
Published: West Sussex, Eng. ; Hoboken, N.J. : J. Wiley & Sons, ©2002.
Edition:3rd ed.
Subjects:
Online Access:CONNECT

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250 |a 3rd ed. 
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505 0 0 |t Basics --  |t Gaussian Optics --  |t Interference --  |t Diffraction --  |t Light Sources and Detectors --  |t Holography --  |t Moire Methods, Triangulation --  |t Speckle Methods --  |t Photoelasticity and Polarized Light --  |t Digital Image Processing --  |t Fringe Analysis --  |t Computerized Optical Processes --  |t Fibre Optics Metrology --  |t Complex Numbers --  |t Fourier Optics --  |t Fourier Series --  |t The Least Squares Error Method --  |t Semiconductor Devices. 
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520 |a New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.* New introductory sections to all chapters.* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.* Thorough coverage of the CCD camera. 
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